報告題目：Introduction to Nanomechanical Measurements with Atomic Force Microscopy

報告人： Roger Proksch（牛津儀器）

報告時間：2018年12月14日（周五）15:00-16:10 

報告地點： 明故宮校區A18-529會議室  

主辦單位：機械結構力學及控制國家重點實驗室、國際合作處、科協、航空宇航學院

報告內容簡介：

Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for evaluating polymers and polymer blends. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of polymers at small length scales. In addition to familiar topographic imaging, AFMs can probe molecular-level forces; map mechanical, thermal, and electrical properties; and assess solvent and thermal effects in near real time. This talk provides an overview of the AFM’s powerful capabilities for polymers characterization and will cover:

1.           Force-distance curves

2.           Fast force mapping

3.           Force modulation and nano-rheology

4.           Resonant “tapping” modes – phase, loss tangent and AMFM imaging

5.           Contact resonance imaging

報告人簡介：

Roger Proksch牛津儀器AR原子力部門總裁，Asylum Research（已并入牛津儀器）創始人。著名原子力顯微技術專家。已發表高水平學術論文100余篇，其中多篇論文發表在Nature Materials和Nature Nanotechnology等國際頂級期刊上。