報告題目：Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques

報 告 人：Prof. Zeng Kaiyang (Department of Mechanical Engineering, National University of Singapore)

報告時間：2018年12月17日（周一）上午9:00-10：00

報告地點：明故宮校區9號樓506會議室

主辦單位: 國際合作處、航空宇航學院、機械結構力學及控制國家重點實驗室

報告內容簡介：

This talk will discuss the characterization of the local multifield coupling phenomenon (MCP) in various functional/structural materials by using various Scanning Probe Microscopy (SPM)-based techniques. Understanding MCP has great scientific and engineering significance in materials science and engineering, as in many practical applications, materials and devices are operated under a combination of multiple physical fields, such as electric, magnetic, optical, chemical and force fields, and working environments, such as different atmospheres, large temperature fluctuations, humidity, or acidic space. The materials’ responses to the synergetic effects of the multifield (physical and environmental) determine the functionalities, performance, lifetime of the materials, and even the devices’ manufacturing. SPM techniques are effective and powerful tools to characterize the local effects of MCP. Here, an introduction of the local MCP, the descriptions of several important SPM techniques, especially the electrical, mechanical, chemical, and optical related techniques, and the applications of SPM techniques to investigate the local phenomena and mechanisms in oxide materials, energy materials, biomaterials, and supramolecular materials are covered. Finally, an outlook of the MCP and SPM techniques in materials research will be discussed.